Crystallography and Structural Analysis

Crystallography remains a cornerstone in materials characterization, essential for understanding atomic and molecular structures. This track focuses on advanced X-ray diffraction, neutron scattering, electron microscopy, and synchrotron-based techniques to analyze the internal arrangements of solids. Topics include defect analysis, phase identification, crystallographic texture, and in situ structural studies during material synthesis or deformation. Attendees will gain insight into recent developments in automated structure determination, 3D crystallography, and software tools enhancing data interpretation.

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